Category: JIS

JIS

JIS Z 4334:2005

Reference sources for the calibration of surface contamination monitors — Beta-emitters (maximum beta energy greater than 0.15 MeV) and alpha-emitters (FOREIGN STANDARD)
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2005

JIS Z 2343-1:2001

Non-destructive testing — Penetrant testing — Part 1: General principles — Method for liquid penetrant testing and classification of the penetrant indication
standard by Japanese Industrial Standard / Japanese Standards Association, 01/01/2001