TEST PROCEDURE FOR THE MANAGEMENT OF SINGLE-EVENT EFFECTS IN SEMICONDUCTOR DEVICES FROM HEAVY ION IRRADIATION
standard by JEDEC Solid State Technology Association, 12/01/1996
JEDEC JESD313-B (R2001)
THERMAL RESISTANCE MEASUREMENTS OF CONDUCTION COOLED POWER TRANSISTORS
standard by JEDEC Solid State Technology Association, 10/01/1975
JEDEC JESD227
EMBEDDED MULTIMEDIACARD (e-MMC) SECURITY EXTENSION
standard by JEDEC Solid State Technology Association, 11/01/2016
JEDEC JESD82-32
DDR4 DATA BUFFER DEFINITION (DDR4DB01)
standard by JEDEC Solid State Technology Association,
JEDEC JESD8-23
UNIFIED WIDE POWER SUPPLY VOLTAGE RANGE CMOS DC INTERFACE STANDARD FOR NON-TERMINATED DIGITAL INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 10/01/2009
JEDEC JESD51
METHODOLOGY FOR THE THERMAL MEASUREMENT OF COMPONENT PACKAGES (SINGLE SEMICONDUCTOR DEVICE)
standard by JEDEC Solid State Technology Association, 12/01/1995
JEDEC JS 001
ELECTROSTATIC DISCHARGE SENSITIVITY TESTING, HUMAN BODY MODEL (HBM) – COMPONENT LEVEL
standard by JEDEC Solid State Technology Association, 04/01/2010
JEDEC JESD82-18A
STANDARD FOR DEFINITION OF THE CUA877 AND CU2A877 PLL CLOCK DRIVERSFOR REGISTERED DDR2 DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 01/01/2007
JEDEC JESD670A
QUALITY SYSTEM ASSESSMENT
standard by JEDEC Solid State Technology Association, 10/01/2013
JEDEC JESD235
HIGH BANDWIDTH MEMORY (HBM) DRAM
standard by JEDEC Solid State Technology Association, 10/01/2013