Half Price Standard Code

STRESS-TEST-DRIVEN QUALIFICATION OF AND FAILURE MECHANISMS ASSOCIATED WITH ASSEMBLED SOLID STATE SURFACE-MOUNT COMPONENTS
standard by JEDEC Solid State Technology Association, 05/01/2005

ADDENDUM No. 7 to JESD24 – COMMUTATING DIODE SAFE OPERATING AREA TEST PROCEDURE FOR MEASURING dv/dt DURING REVERSE RECOVERY OF POWER TRANSISTORS
Amendment by JEDEC Solid State Technology Association, 08/01/1982

SOLDER BALL SHEAR
standard by JEDEC Solid State Technology Association, 10/01/2006

STRESS-TEST-DRIVEN QUALIFICATION OF INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 08/01/2018

IC LATCH-UP TEST
standard by JEDEC Solid State Technology Association, 11/01/2011

Test Trace for 64 GB – 128 GB SSD
Directive by JEDEC Solid State Technology Association, 07/01/2012

JOINT IPC/JEDEC STANDARD FOR ACOUSTIC MICROSCOPY FOR NONHERMETRIC ENCAPSULATED ELECTRONIC COMPONENTS
standard by JEDEC Solid State Technology Association, 05/01/1999

UNIVERSAL FLASH STORAGE (UFS) CARD EXTENSION
standard by JEDEC Solid State Technology Association, 03/01/2016

THERMAL MODELING OVERVIEW
standard by JEDEC Solid State Technology Association, 10/01/2008

DESCRIPTION OF 1.8 V CMOS LOGIC DEVICES
standard by JEDEC Solid State Technology Association, 04/01/2000