STEADY-STATE TEMPERATURE HUMIDITY BIAS LIFE TEST
standard by JEDEC Solid State Technology Association, 07/01/2015
JEDEC JESD 22-A117B
ELECTRICALLY ERASABLE PROGRAMMABLE ROM (EEPROM) PROGRAM/ERASE ENDURANCE AND DATA RETENTION TEST
standard by JEDEC Solid State Technology Association, 03/01/2009
JEDEC JESD 24-2 (R2002)
ADDENDUM No. 2 to JESD24 – GATE CHARGE TEST METHOD
Amendment by JEDEC Solid State Technology Association, 01/01/1991
JEDEC JESD99C
Terms, Definitions, and Letter Symbols for Microelectronic Devices
standard by JEDEC Solid State Technology Association, 12/01/2012
JEDEC JESD212A
GDDR5 SGRAM
standard by JEDEC Solid State Technology Association, 04/01/2013
JEDEC JEP153
CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES
standard by JEDEC Solid State Technology Association, 01/01/2008
JEDEC JESD22-A113G
PRECONDITIONING OF PLASTIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
standard by JEDEC Solid State Technology Association, 10/01/2015
JEDEC JESD 46C
CUSTOMER NOTIFICATION OF PRODUCT/PROCESS CHANGES BY SEMICONDUCTOR SUPPLIERS
standard by JEDEC Solid State Technology Association, 10/01/2006
JEDEC JESD22-B110B
Mechanical Shock – Component and Subassembly
standard by JEDEC Solid State Technology Association, 07/01/2013
JEDEC JESD209-5
Low Power Double Data Rate 5 (LPDDR5)
standard by JEDEC Solid State Technology Association, 02/01/2019