Half Price Standard Code

CHARACTERIZATION AND MONITORING OF THERMAL STRESS TEST OVEN TEMPURATURES
standard by JEDEC Solid State Technology Association, 03/01/2014

2.5 V BiCMOS LOGIC DEVICE FAMILY SPECIFICATION WITH 5 V TOLERANT INPUTS AND OUTPUTS
standard by JEDEC Solid State Technology Association, 06/01/1999

FOUNDRY PROCESS QUALIFICATION GUIDELINES (Wafer Fabrication Manufacturing Sites)
standard by JEDEC Solid State Technology Association, 02/01/2014

TEST METHOD FOR BEAM ACCELERATED SOFT ERROR RATE
standard by JEDEC Solid State Technology Association, 11/01/2007

ADAPTER TEST BOARD RELIABILITY TEST GUIDELINES
standard by JEDEC Solid State Technology Association, 01/01/2018

THE MEASUREMENT OF TRANSISTOR EQUIVALENT NOISE VOLTAGE AND EQUIVALENT NOISE CURRENT AT FREQUENCIES OF UP TO 20 kHz
standard by JEDEC Solid State Technology Association, 04/01/1968

DEFINITION OF THE SSTU32864 1.8-V CONFIGURABLE REGISTERED BUFFER FOR DDR2 RDIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 10/01/2004

JOINT JEDEC/ECA STANDARD, DEFINING "LOW-HALOGEN" PASSIVES AND SOLID STATE DEVICES (Removal of BFR/CFR/PVC)
standard by JEDEC Solid State Technology Association, 08/01/2011

STANDARD FOR DEFINITION OF CUA845 PLL CLOCK DRIVER FOR REGISTERED DDR2 DIMM APPLICATIONS
standard by JEDEC Solid State Technology Association, 01/01/2007

TEST PROCEDURES FOR VERIFICATION OF MAXIMUM RATINGS OF POWER TRANSISTORS
standard by JEDEC Solid State Technology Association, 12/01/1967