Half Price Standard Code

QUALITY AND RELIABILITY STANDARDS AND PUBLICATIONS
standard by JEDEC Solid State Technology Association, 10/01/1999

COMMON FLASH INTERFACE (CFI)
standard by JEDEC Solid State Technology Association, 09/01/2003

MEASUREMENT OF SMALL VALUES OF TRANSISTOR CAPACITANCE
standard by JEDEC Solid State Technology Association, 02/01/1967

3D Chip Stack with Through-Silicon Vias (TSVS): Identifying, Evaluating and Understanding Reliability Interactions
standard by JEDEC Solid State Technology Association, 11/01/2009

Addendum No. 1 to JESD79-3 – 1.35 V DDR3L-800, DDR3L-1066, DDR3L-1333, and DDR3L-1600
Amendment by JEDEC Solid State Technology Association, 07/01/2010

Byte Addressable Energy Backed Interface
standard by JEDEC Solid State Technology Association, 07/01/2017

INTEGRATED CIRCUITS THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – NATURAL CONVECTION (STILL AIR)
standard by JEDEC Solid State Technology Association, 01/01/2007

GUIDE FOR STANDARD PROBE PAD SIZES AND LAYOUTS FOR WAFER LEVEL ELECTRICAL TESTING
standard by JEDEC Solid State Technology Association, 11/01/1996

INTEGRATED CIRCUIT THERMAL TEST METHOD ENVIRONMENTAL CONDITIONS – JUNCTION-TO-BOARD
standard by JEDEC Solid State Technology Association, 10/01/1999

SEMICUSTOM INTEGRATED CIRCUITS (FORMERLY PUBLISHED AS STANDARD FOR GATE ARRAY BENCHMARK SET)
standard by JEDEC Solid State Technology Association, 06/01/1985