, Test Procedure for the Measurement of Terrestrial Cosmic Ray Induced Destructive Effects in Power Semiconductor Devices
standard by JEDEC Solid State Technology Association, 12/01/2015
JEDEC JESD217
TEST METHODS TO CHARACTERIZE VOIDING IN PRE-SMT BALL GRID ARRAY PACKAGES
standard by JEDEC Solid State Technology Association, 09/01/2010
JEDEC JESD82-20A
FBDIMM: ADVANCED MEMORY BUFFER (AMB)
standard by JEDEC Solid State Technology Association, 03/01/2009
JEDEC JESD22-A102D
ACCELERATED MOISTURE RESISTANCE – UNBIASED AUTOCLAVE
standard by JEDEC Solid State Technology Association, 11/01/2010
JEDEC JESD 8-11A.01
ADDENDUM No. 11A.01 to JESD8 – 1.5 V +/- 0.1 V (NORMAL RANGE) AND 0.9 – 1.6 V (WIDE RANGE) POWER SUPPLY VOLTAGE AND INTERFACE STANDARD FOR NONTERMINATED DIGITAL INTEGRATED CIRCUITS
standard by JEDEC Solid State Technology Association, 09/01/2007
JEDEC JESD9C
Inspection Criteria for Microelectronic Packages and Covers
standard by JEDEC Solid State Technology Association, 05/01/2017
JEDEC JESD229-2
WIDE I/O 2 (WideIO2)
standard by JEDEC Solid State Technology Association, 08/01/2014
JEDEC JESD659B
FAILURE-MECHANISM-DRIVEN RELIABILITY MONITORING
standard by JEDEC Solid State Technology Association, 02/01/2007
JEDEC JESD219A
Solid-State Drive (SSD) Endurance Workloads
standard by JEDEC Solid State Technology Association, 07/01/2012
JEDEC JESD625B
REQUIREMENTS FOR HANDLING ELECTROSTATIC-DISCHARGE-SENSITIVE (ESDS) DEVICES
standard by JEDEC Solid State Technology Association, 01/01/2012