Luminaire performance – Part 1: General requirements
standard by International Electrotechnical Commission, 09/03/2014
IEC 62615 Ed. 1.0 b:2010
Electrostatic discharge sensitivity testing – Transmission line pulse (TLP) – Component level
standard by International Electrotechnical Commission, 05/31/2010
IEC 63068-2 Ed. 1.0 en:2019
Semiconductor devices ¿¿¿ Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices – Part 2: Test method for defects using optical inspection
standard by International Electrotechnical Commission, 01/30/2019
IEC 80601-2-49 Ed. 1.0 b:2018
Medical electrical equipment – Part 2-49: Particular requirements for the basic safety and essential performance of multifunction patient monitors
standard by International Electrotechnical Commission, 03/08/2018
IEC 62637-1 Ed. 1.0 b:2011
Battery charging interface for small handheld multimedia devices – Part 1: 2 mm barrel interface
standard by International Electrotechnical Commission, 03/30/2011
IEC 62841-2-10 Ed. 1.0 b:2017
Electric motor-operated hand-held tools, transportable tools and lawn and garden machinery – Safety – Part 2-10: Particular requirements for hand-held mixers
standard by International Electrotechnical Commission, 02/10/2017
IEC 63093-12 Ed. 1.0 b:2019
Ferrite cores – Guidelines on dimensions and the limits of surface irregularities – Part 12: Ring-cores
standard by International Electrotechnical Commission, 04/04/2019
IEC 62974-1 Ed. 1.0 b:2017
Monitoring and measuring systems used for data collection, gathering and analysis – Part 1: Device requirements
standard by International Electrotechnical Commission, 05/22/2017
IEC 62680-2-3 Ed. 1.0 en:2015
Universal serial bus interfaces for data and power – Part 2-3: Universal Serial Bus Cables and Connectors Class Document Revision 2.0
standard by International Electrotechnical Commission, 09/09/2015
IEC 62908-13-10 Ed. 1.0 en:2016
Touch and interactive displays – Part 13-10: Reliability test methods of touch displays – Environmental durability test methods
standard by International Electrotechnical Commission, 11/25/2016